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cpe:2.3:h:qualcomm:snapdragon_429_mobile:*:*:*:*:*:*:*:*

part: h version: * update: *

VendorQualcomm (4194a0de-9926-556d-a143-7609c2315dd6)
ProductSnapdragon 429 Mobile (b64da47b-0642-500b-8284-3caba494d78d)
Edition*
Language*
Software edition*
Target software*
Target hardware*
Other*
NotesImported from gcve-enriched-dumps CVE data

PURL mappings

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Vulnerability references

IdentifiercpeApplicabilitySubmitteddb.gcve.eu detailsRationale
CVE:CVE-2024-53023 not_vulnerable 2026-06-08 06:54:13.944396 Use After Free in Automotive Android OS
HIGH (7.8)
Memory corruption may occur while accessing a variable during extended back to back tests.
Published: 2025-03-03T10:07:37.488Z
Updated: 2026-02-26T19:09:49.321Z
Reference links
Imported from gcve-enriched-dumps CVE data

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