Snapdragon 429 Mobile
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cpe:2.3:h:qualcomm:snapdragon_429_mobile:*:*:*:*:*:*:*:*
part: h version: * update: *
| Vendor | Qualcomm (4194a0de-9926-556d-a143-7609c2315dd6) |
|---|---|
| Product | Snapdragon 429 Mobile (b64da47b-0642-500b-8284-3caba494d78d) |
| Edition | * |
| Language | * |
| Software edition | * |
| Target software | * |
| Target hardware | * |
| Other | * |
| Notes | Imported from gcve-enriched-dumps CVE data |
PURL mappings
| PURL | Source | Last updated |
|---|---|---|
| No PURL mappings for this CPE yet. | ||
Vulnerability references
| Identifier | cpeApplicability | Submitted | db.gcve.eu details | Rationale |
|---|---|---|---|---|
CVE:CVE-2024-53023 |
not_vulnerable | 2026-06-08 06:54:13.944396 |
Use After Free in Automotive Android OS
HIGH (7.8)
Memory corruption may occur while accessing a variable during extended back to back tests.
Published: 2025-03-03T10:07:37.488Z
Updated: 2026-02-26T19:09:49.321Z |
Imported from gcve-enriched-dumps CVE data |
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